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Details for article 2044 of 6662 found articles
| Title: |
First-principles study of leakage current through thin
SiO
2
films |
| Author: |
Nakagawa, Daisuke Kutsuki, Katsuhiro Ono, Tomoya Hirose, Kikuji |
| Appeared in: |
Physica. B, Condensed matter |
| Paging: | Volume 376-377 (2006) nr. C pages 3 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2044 of 6662 found articles
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